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APPLIED MATERIALS (AMAT) WF-736
    描述
    AMAT WF-736DUV DF Defect inspection tool
    配置
    無配置
    OEM 代工型號說明
    Using laser-based technology, Applied Materials’ WF-736 system detects defects on patterned wafers (wafers with circuit images printed on them) as they move between processing steps. Defects may include particles, open circuit lines, shorts between lines or other problems.
    文檔

    無文檔

    APPLIED MATERIALS (AMAT)

    WF-736

    verified-listing-icon

    已驗證

    類別
    Defect Inspection

    上次驗證: 超過30天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    114076


    晶圓尺寸:

    8"/200mm


    年份:

    2000


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    APPLIED MATERIALS (AMAT) WF-736

    APPLIED MATERIALS (AMAT)

    WF-736

    Defect Inspection
    年份: 2000條件: 二手
    上次驗證超過30天前

    APPLIED MATERIALS (AMAT)

    WF-736

    verified-listing-icon
    已驗證
    類別
    Defect Inspection
    上次驗證: 超過30天前
    listing-photo-d8748cc9a0104194a7cec4bc1272851c-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    114076


    晶圓尺寸:

    8"/200mm


    年份:

    2000


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    AMAT WF-736DUV DF Defect inspection tool
    配置
    無配置
    OEM 代工型號說明
    Using laser-based technology, Applied Materials’ WF-736 system detects defects on patterned wafers (wafers with circuit images printed on them) as they move between processing steps. Defects may include particles, open circuit lines, shorts between lines or other problems.
    文檔

    無文檔

    類似上架商品
    查看全部
    APPLIED MATERIALS (AMAT) WF-736

    APPLIED MATERIALS (AMAT)

    WF-736

    Defect Inspection年份: 2000條件: 二手上次驗證:超過30天前