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APPLIED MATERIALS (AMAT) COMPLUS 3T
    描述
    Dark field detection No missing parts Current Wafer size : 12
    配置
    無配置
    OEM 代工型號說明
    The AMAT / APPLIED MATERIALS ComPLUS 3T wafer inspection system detects defects in devices with design rules of 65nm and below. The AMAT / APPLIED MATERIALS ComPLUS 3T is used for darkfield applications. The The AMAT / APPLIED MATERIALS ComPLUS 3T wafer and mask inspection system can be used for 12" wafers. Applied ComPlus 3T Inspection is a patterned wafer inspection system that performs high-speed inspection of all Darkfield and BEOL Brightfield applications for 65nm production. Using dual-angle illumination and proprietary Enlarged GrayField technology, this single-system solution detects a broad range of defect types at production throughput, enabling faster ramp and higher production yield. Based on the highly successful Compass platform, the ComPlus 3T system transcends the boundaries of traditional darkfield and brightfield inspection, covering the widest optical inspection spectrum with one platform. The ComPlus 3T system solution delivers exceptional advantages in system sensitivity and throughput, as well as significant savings to customers who typically purchase multiple highly specialized inspection tools to cover the same range of applications.
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    APPLIED MATERIALS (AMAT)

    COMPLUS 3T

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    已驗證

    類別
    Defect Inspection

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    Deinstalled


    產品編號:

    107072


    晶圓尺寸:

    8"/200mm, 12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    APPLIED MATERIALS (AMAT) COMPLUS 3T

    APPLIED MATERIALS (AMAT)

    COMPLUS 3T

    Defect Inspection
    年份: 0條件: 二手
    上次驗證超過60天前

    APPLIED MATERIALS (AMAT)

    COMPLUS 3T

    verified-listing-icon
    已驗證
    類別
    Defect Inspection
    上次驗證: 超過60天前
    listing-photo-ecadf588a59d462a92a1ca14d4d23405-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    Deinstalled


    產品編號:

    107072


    晶圓尺寸:

    8"/200mm, 12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Dark field detection No missing parts Current Wafer size : 12
    配置
    無配置
    OEM 代工型號說明
    The AMAT / APPLIED MATERIALS ComPLUS 3T wafer inspection system detects defects in devices with design rules of 65nm and below. The AMAT / APPLIED MATERIALS ComPLUS 3T is used for darkfield applications. The The AMAT / APPLIED MATERIALS ComPLUS 3T wafer and mask inspection system can be used for 12" wafers. Applied ComPlus 3T Inspection is a patterned wafer inspection system that performs high-speed inspection of all Darkfield and BEOL Brightfield applications for 65nm production. Using dual-angle illumination and proprietary Enlarged GrayField technology, this single-system solution detects a broad range of defect types at production throughput, enabling faster ramp and higher production yield. Based on the highly successful Compass platform, the ComPlus 3T system transcends the boundaries of traditional darkfield and brightfield inspection, covering the widest optical inspection spectrum with one platform. The ComPlus 3T system solution delivers exceptional advantages in system sensitivity and throughput, as well as significant savings to customers who typically purchase multiple highly specialized inspection tools to cover the same range of applications.
    文檔

    無文檔

    類似上架商品
    查看全部
    APPLIED MATERIALS (AMAT) COMPLUS 3T

    APPLIED MATERIALS (AMAT)

    COMPLUS 3T

    Defect Inspection年份: 0條件: 二手上次驗證:超過60天前
    APPLIED MATERIALS (AMAT) COMPLUS 3T

    APPLIED MATERIALS (AMAT)

    COMPLUS 3T

    Defect Inspection年份: 2005條件: 翻新的上次驗證:超過60天前
    APPLIED MATERIALS (AMAT) COMPLUS 3T

    APPLIED MATERIALS (AMAT)

    COMPLUS 3T

    Defect Inspection年份: 2006條件: 二手上次驗證:超過60天前