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APPLIED MATERIALS (AMAT) UVISION 200
    描述
    System has always been under full service contract and is in very good conditioning. Uvision SP 200 is a BF (Bright Field) wafer inspection tool It is designed to inspect pattern wafers, but it can also inspect bare and unpatterned wafers Ligth source: Laser ( ג= 266 nm) Tool scans a wafer in a meander path Die to Die ” and Cell to Cell ” comparison capability Can use reflected --( BrigthField ) and scattered signal (GF = GreyField ) in parallel for detection On pattern wafers capable of detecting defects of 25 nm with 90 % Capture Rate (Data from D&E recipe
    配置
    Uvision SP 200 is a BF (Bright Field) wafer inspection tool 200/300 mm capebiliity It is designed to inspect pattern wafers, but it can also inspect bare and unpatterned wafers Ligth source: Laser ( ג= 266 nm) Tool scans a wafer in a meander path Die to Die ” and Cell to Cell ” comparison capability Can use reflected --( BrigthField ) and scattered signal (GF = GreyField ) in parallel for detection On pattern wafers capable of detecting defects of 25 nm with 90 % Capture Rate (Data from D&E recipe,
    OEM 代工型號說明
    未提供
    文檔

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    APPLIED MATERIALS (AMAT)

    UVISION 200

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    已驗證

    類別
    Defect Inspection

    上次驗證: 超過30天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    Installed / Running


    產品編號:

    113572


    晶圓尺寸:

    12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
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    APPLIED MATERIALS (AMAT) UVISION 200

    APPLIED MATERIALS (AMAT)

    UVISION 200

    Defect Inspection
    年份: 2006條件: 二手
    上次驗證超過60天前

    APPLIED MATERIALS (AMAT)

    UVISION 200

    verified-listing-icon
    已驗證
    類別
    Defect Inspection
    上次驗證: 超過30天前
    listing-photo-5bea7f55705c4ad5abbb43a73b2caae3-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    Installed / Running


    產品編號:

    113572


    晶圓尺寸:

    12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    System has always been under full service contract and is in very good conditioning. Uvision SP 200 is a BF (Bright Field) wafer inspection tool It is designed to inspect pattern wafers, but it can also inspect bare and unpatterned wafers Ligth source: Laser ( ג= 266 nm) Tool scans a wafer in a meander path Die to Die ” and Cell to Cell ” comparison capability Can use reflected --( BrigthField ) and scattered signal (GF = GreyField ) in parallel for detection On pattern wafers capable of detecting defects of 25 nm with 90 % Capture Rate (Data from D&E recipe
    配置
    Uvision SP 200 is a BF (Bright Field) wafer inspection tool 200/300 mm capebiliity It is designed to inspect pattern wafers, but it can also inspect bare and unpatterned wafers Ligth source: Laser ( ג= 266 nm) Tool scans a wafer in a meander path Die to Die ” and Cell to Cell ” comparison capability Can use reflected --( BrigthField ) and scattered signal (GF = GreyField ) in parallel for detection On pattern wafers capable of detecting defects of 25 nm with 90 % Capture Rate (Data from D&E recipe,
    OEM 代工型號說明
    未提供
    文檔

    無文檔

    類似上架商品
    查看全部
    APPLIED MATERIALS (AMAT) UVISION 200

    APPLIED MATERIALS (AMAT)

    UVISION 200

    Defect Inspection年份: 2006條件: 二手上次驗證:超過60天前
    APPLIED MATERIALS (AMAT) UVISION 200

    APPLIED MATERIALS (AMAT)

    UVISION 200

    Defect Inspection年份: 0條件: 二手上次驗證:超過30天前