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APPLIED MATERIALS (AMAT) SEMVISION G3
  • APPLIED MATERIALS (AMAT) SEMVISION G3
  • APPLIED MATERIALS (AMAT) SEMVISION G3
  • APPLIED MATERIALS (AMAT) SEMVISION G3
  • APPLIED MATERIALS (AMAT) SEMVISION G3
  • APPLIED MATERIALS (AMAT) SEMVISION G3
  • APPLIED MATERIALS (AMAT) SEMVISION G3
  • APPLIED MATERIALS (AMAT) SEMVISION G3
  • APPLIED MATERIALS (AMAT) SEMVISION G3
描述
無描述
配置
SMIF
OEM 代工型號說明
The high-throughput, fully automatic Applied SEMVision G3 Defect Analysis products enable customers to use this technology as an integral part of their production lines to analyze defects as small as 30nm with industry-leading throughput. DR-SEMs review defects on the wafer (such as particles, scratches or residues) that are first located by a defect detection system and then classify the defects to identify their source. The high-throughput, fully automatic Applied SEMVisiontm G3 Defect Analysis products enable customers to use this technology as an integral part of their production lines to analyze defects as small as 30nm with industry-leading throughput. The Applied SEMVision G3 FIB integrates advanced defect review SEM capability with automated focused ion beam (FIB) technology in one system. The FIB provides a cross-sectional view of the defects reviewed by the SEM, enabling chipmakers to analyze the defects in minutes as part of their in-line review process.
文檔

APPLIED MATERIALS (AMAT)

SEMVISION G3

verified-listing-icon

已驗證

類別
Defect Inspection

上次驗證: 24 天前

關鍵商品詳情

條件:

Used


作業狀態:

未知


產品編號:

118252


晶圓尺寸:

8"/200mm


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

APPLIED MATERIALS (AMAT)

SEMVISION G3

verified-listing-icon
已驗證
類別
Defect Inspection
上次驗證: 24 天前
listing-photo-7649f29088684b96912e636bcce64358-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1979/7649f29088684b96912e636bcce64358/d98ee5caa27841ffacebe56739f0c567_b09222fe7c305630449b8b28056989fb1_mw.jpg
listing-photo-7649f29088684b96912e636bcce64358-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1979/7649f29088684b96912e636bcce64358/15bd567c3f374ff9bc8f2d8ad15d5f41_f659ecaaa4cd965938d907ef41be1920_mw.jpg
listing-photo-7649f29088684b96912e636bcce64358-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1979/7649f29088684b96912e636bcce64358/71eca5b1a66f46c1885677259a340dc0_5e97d19967e4e9db1214c2fdfdcd928a_mw.jpg
listing-photo-7649f29088684b96912e636bcce64358-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1979/7649f29088684b96912e636bcce64358/0bc572af21aa4c1bb35686a4320e0e4d_64fb730d50b541bc419d32d04e6faaac_mw.jpg
listing-photo-7649f29088684b96912e636bcce64358-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1979/7649f29088684b96912e636bcce64358/1b3ee9481e6446b68e65f8fb26320cd2_5400f56ea4b42608039051e6134230c7_mw.jpg
listing-photo-7649f29088684b96912e636bcce64358-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1979/7649f29088684b96912e636bcce64358/32cac3ab83f1425cb55363fca908d0aa_6217f006633dfbb107f4d86519d19c39_mw.jpg
listing-photo-7649f29088684b96912e636bcce64358-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1979/7649f29088684b96912e636bcce64358/37b664614862488a9109d9147a3321ef_2d5699a6af864934f5e4f8d0c1079f65_mw.jpg
listing-photo-7649f29088684b96912e636bcce64358-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1979/7649f29088684b96912e636bcce64358/d430db92d0bf48d789ba4955c4f9bb34_711ff5a542fba9bd71b71cc63acb2228_mw.jpg
關鍵商品詳情

條件:

Used


作業狀態:

未知


產品編號:

118252


晶圓尺寸:

8"/200mm


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述
配置
SMIF
OEM 代工型號說明
The high-throughput, fully automatic Applied SEMVision G3 Defect Analysis products enable customers to use this technology as an integral part of their production lines to analyze defects as small as 30nm with industry-leading throughput. DR-SEMs review defects on the wafer (such as particles, scratches or residues) that are first located by a defect detection system and then classify the defects to identify their source. The high-throughput, fully automatic Applied SEMVisiontm G3 Defect Analysis products enable customers to use this technology as an integral part of their production lines to analyze defects as small as 30nm with industry-leading throughput. The Applied SEMVision G3 FIB integrates advanced defect review SEM capability with automated focused ion beam (FIB) technology in one system. The FIB provides a cross-sectional view of the defects reviewed by the SEM, enabling chipmakers to analyze the defects in minutes as part of their in-line review process.
文檔