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APPLIED MATERIALS (AMAT) COMPLUS MP
    描述
    Darkfield Inspection
    配置
    無配置
    OEM 代工型號說明
    AMAT / APPLIED MATERIALS ComPlus MP is a wafer inspection system which can be used with 8" wafer sizes. The ComPlus-EV can be further enhanced with the MP (Multi-Perspective) option, which extends the system's exceptional capabilities to perform additional brightfield applications, including the detection of defects in the transistor area such as STI, gate, and tungsten plug layers. The MP option expands the number of detectors and magnifications, enabling higher sensitivity to flat defects at an increased capture rate, providing significantly higher throughput and reduced cost of ownership.
    文檔

    無文檔

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    verified-listing-icon

    已驗證

    類別
    Defect Inspection

    上次驗證: 7 天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    83117


    晶圓尺寸:

    8"/200mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect Inspection
    年份: 0條件: 二手
    上次驗證7 天前

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    verified-listing-icon
    已驗證
    類別
    Defect Inspection
    上次驗證: 7 天前
    listing-photo-311c14888888489ea2197d7484daa27f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    83117


    晶圓尺寸:

    8"/200mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Darkfield Inspection
    配置
    無配置
    OEM 代工型號說明
    AMAT / APPLIED MATERIALS ComPlus MP is a wafer inspection system which can be used with 8" wafer sizes. The ComPlus-EV can be further enhanced with the MP (Multi-Perspective) option, which extends the system's exceptional capabilities to perform additional brightfield applications, including the detection of defects in the transistor area such as STI, gate, and tungsten plug layers. The MP option expands the number of detectors and magnifications, enabling higher sensitivity to flat defects at an increased capture rate, providing significantly higher throughput and reduced cost of ownership.
    文檔

    無文檔

    類似上架商品
    查看全部
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect Inspection年份: 0條件: 二手上次驗證:7 天前
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect Inspection年份: 0條件: 二手上次驗證:7 天前
    APPLIED MATERIALS (AMAT) COMPLUS MP

    APPLIED MATERIALS (AMAT)

    COMPLUS MP

    Defect Inspection年份: 0條件: 二手上次驗證:超過60天前