描述
無描述配置
QPA_DefectOEM 代工型號說明
Compass 300 Inspection system, tailored for monitoring processes up to the 100nm tech node. Detect critical flaws efficiently using OMNIView™, a cutting-edge laser scanning method that captures diverse defects across all layers.文檔
無文檔
類別
Defect Inspection
上次驗證: 12 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
144874
晶圓尺寸:
12"/300mm
年份:
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
APPLIED MATERIALS (AMAT)
COMPASS 300
類別
Defect Inspection
上次驗證: 12 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
144874
晶圓尺寸:
12"/300mm
年份:
2002
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
QPA_DefectOEM 代工型號說明
Compass 300 Inspection system, tailored for monitoring processes up to the 100nm tech node. Detect critical flaws efficiently using OMNIView™, a cutting-edge laser scanning method that captures diverse defects across all layers.文檔
無文檔