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HITACHI S-9380
    描述
    無描述
    配置
    - Hitachi W51010T
    OEM 代工型號說明
    The S-9380 is Hitachi’s most advanced CD-measurement SEM developed for 65 nm process control of semiconductor devices on wafers up to 300 mm in diameter. With improvement in both hardware and software, the S-9380 supports a high throughput of 33 wafers per hour with 20 measurement points per wafer, and resolution of 2.0 nm.
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    HITACHI

    S-9380

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    已驗證

    類別

    CD-SEM
    上次驗證: 13 天前
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    103599


    晶圓尺寸:

    未知


    年份:

    2008

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    類似上架商品
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    HITACHI S-9380
    HITACHIS-9380CD-SEM
    年份: 0條件: 二手
    上次驗證昨日

    HITACHI

    S-9380

    verified-listing-icon

    已驗證

    類別

    CD-SEM
    上次驗證: 13 天前
    listing-photo-87e1fe7e58804e8c809b45b4f122775c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77608/87e1fe7e58804e8c809b45b4f122775c/1259d7908b2243af96adf3bfb118e98b_34d2eaffd8b34864b4700958cd08f2f645005c_mw.jpeg
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    listing-photo-87e1fe7e58804e8c809b45b4f122775c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77608/87e1fe7e58804e8c809b45b4f122775c/bcecc791e3914cffbef81ac9bb88fb68_75c616c377c64e5db26bd541e87acba845005c_mw.jpeg
    listing-photo-87e1fe7e58804e8c809b45b4f122775c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/77608/87e1fe7e58804e8c809b45b4f122775c/e084f2c5ed3a4a8e92adef9490135933_b60cdc75d0354257a3cc5b6103d5e95845005c_mw.jpeg
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    103599


    晶圓尺寸:

    未知


    年份:

    2008


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    - Hitachi W51010T
    OEM 代工型號說明
    The S-9380 is Hitachi’s most advanced CD-measurement SEM developed for 65 nm process control of semiconductor devices on wafers up to 300 mm in diameter. With improvement in both hardware and software, the S-9380 supports a high throughput of 33 wafers per hour with 20 measurement points per wafer, and resolution of 2.0 nm.
    文檔

    無文檔

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