描述
無描述配置
Resolution 5nm, Repeatability 1%, CD range ≥0.1μm Original spec - 8inch Si Notched Modified spec - 8inch Si/ SiC/ GaAs/ GaN/LiTaO/ SapphireOEM 代工型號說明
High-resolution critical-dimension measurement scanning electron microscopes (CD-SEMs)文檔
無文檔
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HITACHI
S-8840
類別
CD-SEM
上次驗證: 超過60天前
關鍵商品詳情
條件:
Refurbished
作業狀態:
未知
產品編號:
131710
晶圓尺寸:
8"/200mm
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
Resolution 5nm, Repeatability 1%, CD range ≥0.1μm Original spec - 8inch Si Notched Modified spec - 8inch Si/ SiC/ GaAs/ GaN/LiTaO/ SapphireOEM 代工型號說明
High-resolution critical-dimension measurement scanning electron microscopes (CD-SEMs)文檔
無文檔