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APPLIED MATERIALS (AMAT) VeritySEM 4i+
  • APPLIED MATERIALS (AMAT) VeritySEM 4i+
  • APPLIED MATERIALS (AMAT) VeritySEM 4i+
  • APPLIED MATERIALS (AMAT) VeritySEM 4i+
描述
無描述
配置
無配置
OEM 代工型號說明
The Applied VeritySEM 4i+ metrology system uses proprietary SEM imaging technology to enable precise control of the lithography and etching processes, measuring CDs at a precision of less than 0.3nm. Applied’s OPC Check software for the VeritySEM system performs automated qualification of OPC-based (optical proximity correction) chip designs, significantly reducing mask verification time over conventional manual methods.
文檔

無文檔

類別
CD-SEM

上次驗證: 超過60天前

關鍵商品詳情

條件:

Used


作業狀態:

未知


產品編號:

124375


晶圓尺寸:

12"/300mm


年份:

未知


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

APPLIED MATERIALS (AMAT)

VeritySEM 4i+

verified-listing-icon
已驗證
類別
CD-SEM
上次驗證: 超過60天前
listing-photo-2cf8c6ef863a4691abfd77c7b0cdebcd-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
關鍵商品詳情

條件:

Used


作業狀態:

未知


產品編號:

124375


晶圓尺寸:

12"/300mm


年份:

未知


Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述
配置
無配置
OEM 代工型號說明
The Applied VeritySEM 4i+ metrology system uses proprietary SEM imaging technology to enable precise control of the lithography and etching processes, measuring CDs at a precision of less than 0.3nm. Applied’s OPC Check software for the VeritySEM system performs automated qualification of OPC-based (optical proximity correction) chip designs, significantly reducing mask verification time over conventional manual methods.
文檔

無文檔