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描述
SMIF Reticle Size - 6' Wafer Of Type: Notch at 6 o'clock 3 Loadport配置
Process- MetrologyOEM 代工型號說明
VeraSEM™ is a metrology-SEM system that is the first of its kind in the industry. It extends the capabilities of a conventional CD-SEM system beyond just critical dimensional (CD) measurement, allowing for the monitoring of a variety of challenging process parameters. This means that VeraSEM™ provides a more comprehensive and versatile solution for process monitoring, making it a valuable tool for industries that require precise and accurate measurements.文檔
無文檔
類別
CD-SEM
上次驗證: 5 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
110826
晶圓尺寸:
12"/300mm
年份:
2002
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
APPLIED MATERIALS (AMAT)
VeraSEM
類別
CD-SEM
上次驗證: 5 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
110826
晶圓尺寸:
12"/300mm
年份:
2002
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
SMIF Reticle Size - 6' Wafer Of Type: Notch at 6 o'clock 3 Loadport配置
Process- MetrologyOEM 代工型號說明
VeraSEM™ is a metrology-SEM system that is the first of its kind in the industry. It extends the capabilities of a conventional CD-SEM system beyond just critical dimensional (CD) measurement, allowing for the monitoring of a variety of challenging process parameters. This means that VeraSEM™ provides a more comprehensive and versatile solution for process monitoring, making it a valuable tool for industries that require precise and accurate measurements.文檔
無文檔