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KLA Altair 8920i

描述

KLA Altair 8920i AOI Tool KLA Altair 8920i Wafer Frontside Automatic Optical Inspection Tool Combines Brightfield & Darkfield Defect Detection with Flexible LED Illumination Fastest Available Excursion Monitoring Capability for >0.2 um Defects Phoenix 3.0 EFEM with 3ea Loadports for 6” & 8” Wafers High Performance Inspection Objectives: 2X, 3.5X, 5X, 10X High Performance Review Objective: 35X Low Warpage Chuck for 6” & 8” Wafers Multi-Region Based Thresholding Advanced Detection Algorithms Automated Review Sampling Brightfield Review Mode Litho Bevel Centricity Autofocus Capability Rules Based Binning

配置

無配置

OEM 代工型號說明

未提供

文檔

無文檔

KLA

Altair 8920i

verified-listing-icon

已驗證

類別

AOI

上次驗證: 8 天前

關鍵商品詳情

條件:

Used

作業狀態:

未知

產品編號:

153745

晶圓尺寸:

未知

年份:

2021

Logistics Support

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

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KLA Altair 8920i

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年份: 2021條件: 二手

上次驗證8 天前

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年份: 0條件: 二手

上次驗證9 天前

KLA

Altair 8920i

verified-listing-icon

已驗證

類別

AOI

上次驗證: 8 天前

listing-photo-c7d77972309a4efe95f0a8818a5f360c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/c7d77972309a4efe95f0a8818a5f360c/45ef8fd0bb7b4a7fbd9b0ac15399c3ba_be66307770cb45c8a5e2ca1a3592acc61201a_mw.jpeg

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listing-photo-c7d77972309a4efe95f0a8818a5f360c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/c7d77972309a4efe95f0a8818a5f360c/0b1c148420a045a2a311b74909d45ab3_5bcbc36a86454725af59f48c83f84b3e45005c_mw.jpeg

關鍵商品詳情

條件:

Used

作業狀態:

未知

產品編號:

153745

晶圓尺寸:

未知

年份:

2021

Logistics Support

Available

Transaction Insured by Moov

Available

Refurbishment Services

Available

描述

KLA Altair 8920i AOI Tool KLA Altair 8920i Wafer Frontside Automatic Optical Inspection Tool Combines Brightfield & Darkfield Defect Detection with Flexible LED Illumination Fastest Available Excursion Monitoring Capability for >0.2 um Defects Phoenix 3.0 EFEM with 3ea Loadports for 6” & 8” Wafers High Performance Inspection Objectives: 2X, 3.5X, 5X, 10X High Performance Review Objective: 35X Low Warpage Chuck for 6” & 8” Wafers Multi-Region Based Thresholding Advanced Detection Algorithms Automated Review Sampling Brightfield Review Mode Litho Bevel Centricity Autofocus Capability Rules Based Binning

配置

無配置

OEM 代工型號說明

未提供

文檔

無文檔

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KLA Altair 8920i

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AOI年份: 2021條件: 二手上次驗證:8 天前

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KLA

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AOI年份: 0條件: 二手上次驗證:9 天前