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描述
無描述配置
無配置OEM 代工型號說明
The FISCHERSCOPE® X-RAY XDV®-μ instruments are Fischer's high-end X-ray fluorescence series. They offer precise coating thickness measurement and material analysis on tiny structures. Equipped with powerful silicon drift detectors and polycapillary optics, they ensure quick and repeatable measurements with high radiation intensity. These instruments find applications in the electronics and semiconductor industry for measuring small structures like bond surfaces, SMD components, and thin wires. The XDV®-μ instruments feature a long-distance capillary for precise measurements on assembled PCBs and connectors. With a spacious measuring chamber, advanced polycapillary optics, and fast DPP+ digital pulse processor, they deliver accurate and efficient results.文檔
無文檔
類別
X-Ray / XRD / XRF
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
84342
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
FISCHERSCOPE
XDVM-T7.1-W
類別
X-Ray / XRD / XRF
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
84342
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
無配置OEM 代工型號說明
The FISCHERSCOPE® X-RAY XDV®-μ instruments are Fischer's high-end X-ray fluorescence series. They offer precise coating thickness measurement and material analysis on tiny structures. Equipped with powerful silicon drift detectors and polycapillary optics, they ensure quick and repeatable measurements with high radiation intensity. These instruments find applications in the electronics and semiconductor industry for measuring small structures like bond surfaces, SMD components, and thin wires. The XDV®-μ instruments feature a long-distance capillary for precise measurements on assembled PCBs and connectors. With a spacious measuring chamber, advanced polycapillary optics, and fast DPP+ digital pulse processor, they deliver accurate and efficient results.文檔
無文檔