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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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FISCHERSCOPE XDVM-T7.1-W
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    The FISCHERSCOPE® X-RAY XDV®-μ instruments are Fischer's high-end X-ray fluorescence series. They offer precise coating thickness measurement and material analysis on tiny structures. Equipped with powerful silicon drift detectors and polycapillary optics, they ensure quick and repeatable measurements with high radiation intensity. These instruments find applications in the electronics and semiconductor industry for measuring small structures like bond surfaces, SMD components, and thin wires. The XDV®-μ instruments feature a long-distance capillary for precise measurements on assembled PCBs and connectors. With a spacious measuring chamber, advanced polycapillary optics, and fast DPP+ digital pulse processor, they deliver accurate and efficient results.
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    FISCHERSCOPE

    XDVM-T7.1-W

    verified-listing-icon

    已驗證

    類別
    X-Ray / XRD / XRF

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    84342


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
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    FISCHERSCOPE XDVM-T7.1-W

    FISCHERSCOPE

    XDVM-T7.1-W

    X-Ray / XRD / XRF
    年份: 0條件: 二手
    上次驗證超過60天前

    FISCHERSCOPE

    XDVM-T7.1-W

    verified-listing-icon
    已驗證
    類別
    X-Ray / XRD / XRF
    上次驗證: 超過60天前
    listing-photo-7d6b7d80c35f400aa5f88e29f24b0f0f-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    84342


    晶圓尺寸:

    未知


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    The FISCHERSCOPE® X-RAY XDV®-μ instruments are Fischer's high-end X-ray fluorescence series. They offer precise coating thickness measurement and material analysis on tiny structures. Equipped with powerful silicon drift detectors and polycapillary optics, they ensure quick and repeatable measurements with high radiation intensity. These instruments find applications in the electronics and semiconductor industry for measuring small structures like bond surfaces, SMD components, and thin wires. The XDV®-μ instruments feature a long-distance capillary for precise measurements on assembled PCBs and connectors. With a spacious measuring chamber, advanced polycapillary optics, and fast DPP+ digital pulse processor, they deliver accurate and efficient results.
    文檔

    無文檔

    類似上架商品
    查看全部
    FISCHERSCOPE XDVM-T7.1-W

    FISCHERSCOPE

    XDVM-T7.1-W

    X-Ray / XRD / XRF年份: 0條件: 二手上次驗證:超過60天前