NanoSpec AFT 210 VT
概述
The Nanometrics NanoSpec AFT 210 VT is a computerized, optical non-contact thin-film thickness measurement system used primarily in semiconductor manufacturing and cleanrooms.
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The Nanometrics NanoSpec AFT 210 VT is a computerized, optical non-contact thin-film thickness measurement system used primarily in semiconductor manufacturing and cleanrooms.
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檢驗、保險、評估、物流