SEIKO / EPSON

NS-8160MS

The Epson NS8000 IC Test Handler series is designed to support the testing of smartphone, tablet PC and automotive chips even in the most extreme production environments. It has up to 8 sites testing capability and a testing area from 264mm x 149mm. The contact force can go up to 240kgf and it can handle up to 13,500 units per hour (ambient) and up to 8,200 units per hour (high temperature).

NS8080MS

High throughput to support the testing of smartphone, tablet PC and automotive chips even in the most extreme production environments.

Up to 8 sites testing capability
Testing area from 184mm x 149mm
Up to 120Kgf contact force
UPH - up to 13,500 (ambient) & 
Up to 8,200 (High Temperature)

SEIKO / EPSON

概述

活躍中的上架商品

全部產品

服務

最熱門的 SEIKO / EPSON Test Handler

NS-8160MS

NS8080MS

NS8080SH

利用 Moov 將其上架並立即找到完美的買家。

所有 SEIKO / EPSON Test Handler