跳到主要內容
Moov logo

Moov Icon
APPLIED MATERIALS (AMAT) NANOSEM 3D
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    Introduced in fiscal 2002, the NanoSEM 3D system extends CD-SEM technology beyond the measurement of critical dimensions to enable the three-dimensional imaging of chip features to more precisely control their lithography and etch processes.
    文檔

    無文檔

    類別
    CD-SEM

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    44377


    晶圓尺寸:

    未知


    年份:

    2004


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available

    APPLIED MATERIALS (AMAT)

    NANOSEM 3D

    verified-listing-icon
    已驗證
    類別
    CD-SEM
    上次驗證: 超過60天前
    listing-photo-e3068c54bac348348a78ef329fe70d48-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    44377


    晶圓尺寸:

    未知


    年份:

    2004


    Logistics Support
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    Introduced in fiscal 2002, the NanoSEM 3D system extends CD-SEM technology beyond the measurement of critical dimensions to enable the three-dimensional imaging of chip features to more precisely control their lithography and etch processes.
    文檔

    無文檔