描述
無描述配置
無配置OEM 代工型號說明
Light source: Argon ion laser Detecting/scanning method: Scattered light detecting / helical scanning method Detectivity: Bare 0.055 microns / film 0.07 microns Dynamic range: 0.055 microns to 5 microns Reproducibility: σn /≦1% Wafer Size 200/150mm文檔
無文檔
TAKANO / TOPCON
WM-2500
已驗證
類別
Reticle / Mask Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
65917
晶圓尺寸:
8"/200mm
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
TAKANO / TOPCON
WM-2500
類別
Reticle / Mask Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
65917
晶圓尺寸:
8"/200mm
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
無配置OEM 代工型號說明
Light source: Argon ion laser Detecting/scanning method: Scattered light detecting / helical scanning method Detectivity: Bare 0.055 microns / film 0.07 microns Dynamic range: 0.055 microns to 5 microns Reproducibility: σn /≦1% Wafer Size 200/150mm文檔
無文檔