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KLA RS75/TCA
  • KLA RS75/TCA
  • KLA RS75/TCA
描述
無描述
配置
無配置
OEM 代工型號說明
The OmniMap® RS75 series is a tool designed to help semiconductor manufacturers perform accurate wafer characterization and critical production monitoring at substantially greater speeds. It addresses a wide variety of process applications where film thickness and sheet resistance are critical. The RS75/tc model incorporates a patented temperature compensation (tc) solution, allowing the system to correct for temperature variations, dramatically affecting long-term repeatability, accuracy, and system-to-system matching. The RS75 series is offered in a variety of configurations to meet customer production requirements, including automated and manual versions, both of which are available with or without temperature compensation. Models include the Auto RS75/tc, RS75/tc, Auto RS75, and the RS75.
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已驗證

類別
Resistivity / Four Point Probe

上次驗證: 18 天前

關鍵商品詳情

條件:

Used


作業狀態:

Installed / Running


產品編號:

126576


晶圓尺寸:

未知


年份:

2001


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

KLA

RS75/TCA

verified-listing-icon
已驗證
類別
Resistivity / Four Point Probe
上次驗證: 18 天前
listing-photo-484e3f41e0ef4fa5a485a5b6207c3d0c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53066/484e3f41e0ef4fa5a485a5b6207c3d0c/85734074e24848faa9dcc58c8607482f_klatencorers75tca2_mw.jpeg
listing-photo-484e3f41e0ef4fa5a485a5b6207c3d0c-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/53066/484e3f41e0ef4fa5a485a5b6207c3d0c/ef64f1e8e73c4a458ecedab5885994e4_klatencorers75tca1_mw.jpeg
關鍵商品詳情

條件:

Used


作業狀態:

Installed / Running


產品編號:

126576


晶圓尺寸:

未知


年份:

2001


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述
配置
無配置
OEM 代工型號說明
The OmniMap® RS75 series is a tool designed to help semiconductor manufacturers perform accurate wafer characterization and critical production monitoring at substantially greater speeds. It addresses a wide variety of process applications where film thickness and sheet resistance are critical. The RS75/tc model incorporates a patented temperature compensation (tc) solution, allowing the system to correct for temperature variations, dramatically affecting long-term repeatability, accuracy, and system-to-system matching. The RS75 series is offered in a variety of configurations to meet customer production requirements, including automated and manual versions, both of which are available with or without temperature compensation. Models include the Auto RS75/tc, RS75/tc, Auto RS75, and the RS75.
文檔

無文檔