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KLA P-10
    描述
    Surface Profiler Max Wafer:200mm Calibrated to P-10 Specifications - Manual wafer load profilometer - Computer controlled - Measures roughness, waviness, step height, and other surface characteristics - Measures micro-roughness with up to 0.5Å (0.002 min.) resolution over short distances as well as waviness over a full, 60-mm scan.i thin - Built-in PC computing power - Operating System: Windows 3.1 - Windows base software control and data analysis - Brand new stylus - Brand new LCD monitor - Lab Table for KLA P10 Profiler - Operations Manual - Refurbished to Meet Original KLA-Tencor P-10 Specifications
    配置
    無配置
    OEM 代工型號說明
    Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.
    文檔

    無文檔

    KLA

    P-10

    verified-listing-icon

    已驗證

    類別
    Profiler

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Refurbished


    作業狀態:

    未知


    產品編號:

    64809


    晶圓尺寸:

    8"/200mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    KLA P-10

    KLA

    P-10

    Profiler
    年份: 1995條件: 二手
    上次驗證20 天前

    KLA

    P-10

    verified-listing-icon
    已驗證
    類別
    Profiler
    上次驗證: 超過60天前
    listing-photo-82f308d9e1c241e8897fbd9b3bc2c45f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/82f308d9e1c241e8897fbd9b3bc2c45f/35d21811f1454983a1e116fee657b4e6_8641d3ae5bfc45d2aee7308bfcb6cad31201a_mw.jpeg
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    listing-photo-82f308d9e1c241e8897fbd9b3bc2c45f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/82f308d9e1c241e8897fbd9b3bc2c45f/848168dba9c7436f8848e765b3cb3e88_08482878a54a461c92e2d5bd9c997c39_mw.jpeg
    listing-photo-82f308d9e1c241e8897fbd9b3bc2c45f-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/82f308d9e1c241e8897fbd9b3bc2c45f/988da00cb4e543c6abe2b9ff0f1105ad_77868998a97a48c2a37f3d665a8584e51201a_mw.jpeg
    關鍵商品詳情

    條件:

    Refurbished


    作業狀態:

    未知


    產品編號:

    64809


    晶圓尺寸:

    8"/200mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Surface Profiler Max Wafer:200mm Calibrated to P-10 Specifications - Manual wafer load profilometer - Computer controlled - Measures roughness, waviness, step height, and other surface characteristics - Measures micro-roughness with up to 0.5Å (0.002 min.) resolution over short distances as well as waviness over a full, 60-mm scan.i thin - Built-in PC computing power - Operating System: Windows 3.1 - Windows base software control and data analysis - Brand new stylus - Brand new LCD monitor - Lab Table for KLA P10 Profiler - Operations Manual - Refurbished to Meet Original KLA-Tencor P-10 Specifications
    配置
    無配置
    OEM 代工型號說明
    Tencor P-10 is an equipment used for research and development engineering that analyzes various substrates, including glass, ceramics, wafers, disks, and precision-machined surfaces. With an optional MicroHead II low-force measurement head, it can accurately measure soft surfaces like indium, gold, and photoresist.
    文檔

    無文檔

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    查看全部
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    Profiler年份: 1995條件: 二手上次驗證:超過60天前