描述
The Ambios Technology, Inc. XP Stylus Profiler is a computerized, high-sensitivity surface profiler that measures roughness, waviness, and step height in a variety of applications. It features the ability to measure precision step heights from under 10 angstroms to as large as 100 microns (400μm with the extended sensor option), the XP profiler provides more than five orders of magnitude of precision Z height measurement. The XP profiler provides an affordable, high-resolution surface measurement capability that nicely complements other analytical instruments.配置
Ambios XP2 is a standard stylus profilometer for measuring step heights in the tens of nm up to 400 um. Step heights from 50A to 400um can be made using a computer controlled stylus profilometer. The stylus force can be adjusted so polymers samples such as photoresist can be measured. List of the current issues: -The stage squeaks badly -The USB communication fails periodically requiring software and/or hardware restart -Sometimes the stage won’t move during a scan for half the scan, then it will kick onOEM 代工型號說明
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AMBIOS TECHNOLOGY, INC
XP-2
已驗證
類別
Profiler
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
53545
晶圓尺寸:
未知
年份:
2006
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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AMBIOS TECHNOLOGY, INC
XP-2
已驗證
類別
Profiler
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
53545
晶圓尺寸:
未知
年份:
2006
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
The Ambios Technology, Inc. XP Stylus Profiler is a computerized, high-sensitivity surface profiler that measures roughness, waviness, and step height in a variety of applications. It features the ability to measure precision step heights from under 10 angstroms to as large as 100 microns (400μm with the extended sensor option), the XP profiler provides more than five orders of magnitude of precision Z height measurement. The XP profiler provides an affordable, high-resolution surface measurement capability that nicely complements other analytical instruments.配置
Ambios XP2 is a standard stylus profilometer for measuring step heights in the tens of nm up to 400 um. Step heights from 50A to 400um can be made using a computer controlled stylus profilometer. The stylus force can be adjusted so polymers samples such as photoresist can be measured. List of the current issues: -The stage squeaks badly -The USB communication fails periodically requiring software and/or hardware restart -Sometimes the stage won’t move during a scan for half the scan, then it will kick onOEM 代工型號說明
未提供文檔
無文檔
類似上架商品
查看全部無類似上架商品