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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA ARCHER 200
    描述
    無描述
    配置
    Overlay
    OEM 代工型號說明
    The Archer 200 is an optical overlay control system designed to meet the performance and cost-of-ownership requirements for advanced design rules, including 32nm and double-patterning lithography. It features major improvements to its core optical design and an optional scatterometry measurement technology. This system offers tighter total measurement uncertainty, increased flexibility, higher productivity, and faster measurement. It uses industry-standard AIM or smaller µAIM targets.
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    KLA

    ARCHER 200

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    已驗證

    類別
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    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    107555


    晶圓尺寸:

    12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
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    KLA ARCHER 200

    KLA

    ARCHER 200

    Overlay
    年份: 0條件: 二手
    上次驗證超過60天前

    KLA

    ARCHER 200

    verified-listing-icon
    已驗證
    類別
    Overlay
    上次驗證: 超過60天前
    listing-photo-05fb5f6b28fa4d0296a6950a067144bf-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    107555


    晶圓尺寸:

    12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    Overlay
    OEM 代工型號說明
    The Archer 200 is an optical overlay control system designed to meet the performance and cost-of-ownership requirements for advanced design rules, including 32nm and double-patterning lithography. It features major improvements to its core optical design and an optional scatterometry measurement technology. This system offers tighter total measurement uncertainty, increased flexibility, higher productivity, and faster measurement. It uses industry-standard AIM or smaller µAIM targets.
    文檔

    無文檔

    類似上架商品
    查看全部
    KLA ARCHER 200

    KLA

    ARCHER 200

    Overlay年份: 0條件: 二手上次驗證:超過60天前
    KLA ARCHER 200

    KLA

    ARCHER 200

    Overlay年份: 0條件: 二手上次驗證:超過60天前
    KLA ARCHER 200

    KLA

    ARCHER 200

    Overlay年份: 0條件: 二手上次驗證:超過60天前