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VEECO DIMENSION 5000
  • VEECO DIMENSION 5000
  • VEECO DIMENSION 5000
  • VEECO DIMENSION 5000
描述
No missing parts
配置
無配置
OEM 代工型號說明
The Dimension 5000 Scanning Probe Microscope (SPM) is an advanced tool designed for semiconductor and data storage device manufacturers. It is capable of measuring up to one hundred areas on samples as large as 350 mm in diameter. The Dimension 5000 SPM is equipped with a wide range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques, allowing it to detect faults, measure roughness, and analyze other features in three dimensions. One of the key advantages of the Dimension 5000 SPM is that it can perform these measurements without destroying, pretreating, or modifying the sample. This makes it an ideal tool for manufacturers who need to quickly and accurately analyze their products.
文檔

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類別
Microscope

上次驗證: 超過60天前

關鍵商品詳情

條件:

Used


作業狀態:

Installed / Running


產品編號:

101130


晶圓尺寸:

未知


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available

VEECO

DIMENSION 5000

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已驗證
類別
Microscope
上次驗證: 超過60天前
listing-photo-71d8dd9d8b224cb4918016c55a01c9a8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/71d8dd9d8b224cb4918016c55a01c9a8/ad83d40e55c646179b2b7ee9c00d2396_00517dbc457d4e7eb9580eb1ffb0c5431201a_mw.jpeg
listing-photo-71d8dd9d8b224cb4918016c55a01c9a8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/71d8dd9d8b224cb4918016c55a01c9a8/015631599d754a1c8756769bbe9dcc89_cc2e8761e41d40fa98a864fa4bc406961201a_mw.jpeg
listing-photo-71d8dd9d8b224cb4918016c55a01c9a8-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/43608/71d8dd9d8b224cb4918016c55a01c9a8/f4ff31ef369d418bbb713d32df021062_0ac358c7bb944955a54d53b0b9cf92e21201a_mw.jpeg
關鍵商品詳情

條件:

Used


作業狀態:

Installed / Running


產品編號:

101130


晶圓尺寸:

未知


年份:

未知


Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
No missing parts
配置
無配置
OEM 代工型號說明
The Dimension 5000 Scanning Probe Microscope (SPM) is an advanced tool designed for semiconductor and data storage device manufacturers. It is capable of measuring up to one hundred areas on samples as large as 350 mm in diameter. The Dimension 5000 SPM is equipped with a wide range of atomic force microscopy (AFM) and scanning tunneling microscopy (STM) techniques, allowing it to detect faults, measure roughness, and analyze other features in three dimensions. One of the key advantages of the Dimension 5000 SPM is that it can perform these measurements without destroying, pretreating, or modifying the sample. This makes it an ideal tool for manufacturers who need to quickly and accurately analyze their products.
文檔

無文檔