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WYKO / VEECO SP 3200
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    Veeco Bruker Wyko SP9900 Large Format Optical Surface Profiler. Automated non-contact 3D critical dimension measurements. Large format surface profiling system delivers unmatched measurement performance on substrate panels, bumped substrates, flat panels and circuit boards for improved process monitoring and increased yields. High resolution imaging and patented vertical scanning interferometry system can perform accurate 3D critical dimension measurements with nanometer resolution. Powerful surface metrology instrument and defect inspection tool. Measurement Capability: Non-contact, three dimensional, surface, critical dimension, film thickness, tribology. Vertical Measurement Range: 0.1nm to 10mm. Vertical Resolution: Less than 0.1nm. RMS Repeatability: 0.01nm. No Cognex system. 115/230V, 1 Ph, 50/60 Hz, CE. Mfg.: 2008.
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    WYKO / VEECO

    SP 3200

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    上次驗證: 超過60天前
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    產品編號:

    21924


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    年份:

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    WYKO / VEECO

    SP 3200

    verified-listing-icon

    已驗證

    類別

    Profiler
    上次驗證: 超過60天前
    listing-photo-uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/8GpEvJPy2xR_VLuMDsOOL12hQo47IOv-tZ0jmsJltK0/uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw/YnzC35xvfQtPT0qgi8jFbMkRBHwfnGVhFpvpzUNHIB4_20190301_114727_f
    listing-photo-uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/8GpEvJPy2xR_VLuMDsOOL12hQo47IOv-tZ0jmsJltK0/uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw/jlu6NgbV9WiCYOuBDCmnKzeDY_NNjcIHju813UL5m-A_20190301_114727_f
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    listing-photo-uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/8GpEvJPy2xR_VLuMDsOOL12hQo47IOv-tZ0jmsJltK0/uuAKoR6-VXSAqLLmBbmFlOTtIxrGqaMkdvAL9WSdhTw/Jqhe35_ahH2VpNQP19oZWclFkZknL6wFAzU0_5Y5k5Y_20190301_114727_f
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    21924


    晶圓尺寸:

    未知


    年份:

    未知


    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    Veeco Bruker Wyko SP9900 Large Format Optical Surface Profiler. Automated non-contact 3D critical dimension measurements. Large format surface profiling system delivers unmatched measurement performance on substrate panels, bumped substrates, flat panels and circuit boards for improved process monitoring and increased yields. High resolution imaging and patented vertical scanning interferometry system can perform accurate 3D critical dimension measurements with nanometer resolution. Powerful surface metrology instrument and defect inspection tool. Measurement Capability: Non-contact, three dimensional, surface, critical dimension, film thickness, tribology. Vertical Measurement Range: 0.1nm to 10mm. Vertical Resolution: Less than 0.1nm. RMS Repeatability: 0.01nm. No Cognex system. 115/230V, 1 Ph, 50/60 Hz, CE. Mfg.: 2008.
    OEM 代工型號說明
    未提供
    文檔

    無文檔

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