描述
Critical Dimension (CD) Measurement (non SEM)配置
無配置OEM 代工型號說明
A wide range of 2D/3D and in-die metrology solutions for Dielectric and Copper CMP, Photolithography, Etch and CVD文檔
無文檔
NOVA
NS3090Next SA
已驗證
類別
Metrology
上次驗證: 超過30天前
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條件:
Used
作業狀態:
未知
產品編號:
62737
晶圓尺寸:
未知
年份:
未知
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NOVA
NS3090Next SA
類別
Metrology
上次驗證: 超過30天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
62737
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Critical Dimension (CD) Measurement (non SEM)配置
無配置OEM 代工型號說明
A wide range of 2D/3D and in-die metrology solutions for Dielectric and Copper CMP, Photolithography, Etch and CVD文檔
無文檔
類似上架商品
查看全部無類似上架商品