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KLA ARCHER AIM+
    描述
    無描述
    配置
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    OEM 代工型號說明
    The Archer AIM+ is an advanced optical overlay metrology tool that sets the standard for lithography process control through the > 45-nm node. It improves yield and cost of ownership with a 20% increase in throughput over previous-generation solutions. It features field-proven AIM grating-style technology, improved optics design, and high accuracy measurements. Its applications include overlay metrology, CMP, lithography, and wafer surface focus and analysis.
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    KLA ARCHER AIM+.pdf

    KLA

    ARCHER AIM+

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    已驗證

    類別

    Metrology
    上次驗證: 超過60天前
    關鍵商品詳情
    條件:

    Used

    作業狀態:

    未知

    產品編號:

    58340

    晶圓尺寸:

    12"/300mm

    年份:

    2006

    Have Additional Questions?
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    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
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    上次驗證超過60天前

    KLA

    ARCHER AIM+

    verified-listing-icon

    已驗證

    類別

    Metrology
    上次驗證: 超過60天前
    listing-photo-c9a7ee41d2384173a1072f31c6cf684b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1458/c9a7ee41d2384173a1072f31c6cf684b/5b792dddb2854413938d1c39aacf2b4b_d94b1bd8a5ef4f8d82d52a082b6fe7eb1201a_mw.jpeg
    listing-photo-c9a7ee41d2384173a1072f31c6cf684b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1458/c9a7ee41d2384173a1072f31c6cf684b/7c12efc3f1ac4f34880e9181b44ce934_b80c21c9cfa64194a0d7e1285e27d1cd1201a_mw.jpeg
    listing-photo-c9a7ee41d2384173a1072f31c6cf684b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1458/c9a7ee41d2384173a1072f31c6cf684b/4f0bbd1b0d664e2983e2a0ccaad53355_a8cadfeb0c184de1ab35badfa58198e01201a_mw.jpeg
    listing-photo-c9a7ee41d2384173a1072f31c6cf684b-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1458/c9a7ee41d2384173a1072f31c6cf684b/5fdf2e2d74c84ef98310395882061a31_b2ef839e4d094fe2a68c2f6c23ee94951201a_mw.jpeg
    關鍵商品詳情
    條件:

    Used

    作業狀態:

    未知

    產品編號:

    58340

    晶圓尺寸:

    12"/300mm

    年份:

    2006

    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    無描述
    配置
    無配置
    OEM 代工型號說明
    The Archer AIM+ is an advanced optical overlay metrology tool that sets the standard for lithography process control through the > 45-nm node. It improves yield and cost of ownership with a 20% increase in throughput over previous-generation solutions. It features field-proven AIM grating-style technology, improved optics design, and high accuracy measurements. Its applications include overlay metrology, CMP, lithography, and wafer surface focus and analysis.
    文檔
    文件圖示

    KLA ARCHER AIM+.pdf

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    查看全部
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    Metrology年份: 0條件: 翻新的上次驗證: 超過60天前
    KLA ARCHER AIM+
    KLA
    ARCHER AIM+
    Metrology年份: 0條件: 翻新的上次驗證: 超過60天前