The AlerisTM 8330 film metrology system, a targeted solution for production monitoring of the thickness, refractive index and stress of non-critical films at the 32nm node and beyond.

KLA inhabits two worlds: one that’s nanometers in scale and one that’s global. This micro and macro view gives us a unique perspective. We see electrons wave and industries transform. When you put deep science together with optimism, big things happen.

Our process-control and process-enabling solutions are designed to boost the innovation speed of the electronics industry. We help our customers achieve leading-edge performance.

ALERIS 8330

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