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交易市集 > Metrology > KLA / ADE > WAFERCHECK 7000

WAFERCHECK 7000

類別
Metrology
概述

The WaferCheck 7000 series of products are flexible, modular systems capable of automatically characterizing, inspecting and sorting semiconductor wafers. The WaferCheck 7000, the first large-scale, automated metrology system for the wafer manufacturing market.

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