描述
無描述配置
Particle Measuring SAS 5800 Surface Analysis Particle Measuring System. Sizes and locates surface contamination and defects down to 0.10 micro-meters (PSL reference) in a fully automated 100mm - 200mm, cassette to cassette operation. The SAS 5800 includes teo polarized HE-NE Lasers which provide independent S and P polarization analysis. The contamination and defects are assigned as point, line and area defects. Accept/reject criteria is based on particle, scratch, area defect and STS (surface roughness). Sold As Is.OEM 代工型號說明
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PARTICLE MEASURING SYSTEMS (PMS)
LASAIR 110
已驗證
類別
Laser
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
14356
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
PARTICLE MEASURING SYSTEMS (PMS)
LASAIR 110
已驗證
類別
Laser
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
14356
晶圓尺寸:
未知
年份:
未知
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
Particle Measuring SAS 5800 Surface Analysis Particle Measuring System. Sizes and locates surface contamination and defects down to 0.10 micro-meters (PSL reference) in a fully automated 100mm - 200mm, cassette to cassette operation. The SAS 5800 includes teo polarized HE-NE Lasers which provide independent S and P polarization analysis. The contamination and defects are assigned as point, line and area defects. Accept/reject criteria is based on particle, scratch, area defect and STS (surface roughness). Sold As Is.OEM 代工型號說明
未提供文檔
無文檔