概述

The FEI V400ACE is a state-of-the-art Focused Ion Beam (FIB) system that integrates the most recent advancements in ion column technology, gas delivery, and end point detection. This allows for quick, efficient, and cost-effective circuit editing on advanced integrated circuits. With circuit editing, product designers can alter conductive pathways and test the changes within hours, instead of waiting weeks or months to create new masks and process new wafers. The V400ACE is specifically engineered to tackle the challenges posed by modern designs and processes, such as smaller geometries, higher circuit densities, new materials, and intricate interconnect structures.