概述

The Thermo Scientifc™ Helios™ G4 UC DualBeam™ System is part of the fourth generation of the industry-leading Helios DualBeam family. It is carefully designed to meet the needs of scientists and engineers, combining the innovative Thermo Scientific Elstar™ electron column with high-current UC+ technology for extreme high-resolution imaging and the highest materials contrast with the superior Thermo Scientific Tomahawk™ Focused Ion Beam (FIB) ion column for the fastest, easiest, and most precise high-quality sample preparation. In addition to the most advanced electron and ion optics, the Helios G4 UC DualBeam System incorporates a suite of state-ofthe-art technologies that enable simple and consistent highresolution S/TEM and Atom Probe Tomography (APT) sample preparation, as well as the highest-quality subsurface and 3D characterization, even on the most challenging samples.