概述

The Teradyne Z1860vp is a high-performance, multi-site test system designed for testing advanced semiconductor devices. It is a member of the Z18xx series of testers, which are known for their high throughput, high accuracy, and flexibility. The Z1860vp is designed to test a wide range of devices, including memory, logic, mixed-signal, and high-speed devices. It features high-speed digital and mixed-signal measurement capabilities, as well as high-resolution analog measurements. The system also has a large number of digital I/O channels and can be configured with a variety of different testheads and probers to support different device types and package sizes. The Z1860vp also features a powerful software platform that allows for easy test program development and maintenance. It also supports various programming languages such as C, C++, TCL and other languages, it also has built-in tools for test program debugging and analysis. The Z1860vp is well suited for high-volume manufacturing environments, where high throughput and high accuracy are required. It is also well suited for testing devices with high pin counts and complex test requirements. It is ideal for use in semiconductor manufacturing facilities, fabless semiconductor companies, and IDMs. Overall, the Teradyne Z1860vp is a powerful and versatile test system that can be configured to meet the needs of a wide range of device testing applications.