CT1000
概述
Up to 80 devices tested in parallel For Contact, contactless, dual interface, UHF SAM support for crypto contactless devices Parametric and functional test Smart card device family suite editor
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Up to 80 devices tested in parallel For Contact, contactless, dual interface, UHF SAM support for crypto contactless devices Parametric and functional test Smart card device family suite editor
0
檢驗、保險、評估、物流