NX1032XS
概述
IC Test Handler Up to 32 site testing capability Testing area from 344mm x 244mm Up to 480kgf contact force UPH - up to 20,000 (Ambient) & Up to 10,500 (High Temperature)
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IC Test Handler Up to 32 site testing capability Testing area from 344mm x 244mm Up to 480kgf contact force UPH - up to 20,000 (Ambient) & Up to 10,500 (High Temperature)
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檢驗、保險、評估、物流