概述

Magnum SV is a high-mix production solution for memory testing, offering up to 1280 digital pins for parallel testing. It is part of Teradyne’s Magnum test system, which delivers high throughput and high parallel test efficiency for non-volatile memories, static RAM memories, and logic devices. Magnum SV is designed for final test and wafer sort production and is compatible with industry-standard handlers and wafer probers, including hinge and column manipulators. With its low cost and high efficiency, Magnum SV is an excellent choice for memory testing.