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6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA SURFSCAN SP3
    描述
    HD not included Good working condition Wafer Inspection System
    配置
    無配置
    OEM 代工型號說明
    The Surfscan® SP3 is an unpatterned wafer inspection tool available in 450mm, 300mm, and 300mm/450mm bridge tool configurations. It uses deep ultra-violet (DUV) sensitivity and has a throughput up to three times that of its predecessor. It can detect critical defects and surface quality issues for IC, OEM, and substrate manufacturing at the 2Xnm design node. The tool also includes an integrated SURFmonitor module that characterizes and measures surface quality. It has flexible configurations and a reliable, extendible architecture. It is used for qualification and monitoring of process tools for the 2Xnm design node within the IC fab, as well as serving as a lithography process tool monitor. The Surfscan SP3 can also be used for incoming wafer qualification, inline process control, final wafer qualification, process tool qualification, and as a process uniformity monitor.
    文檔

    無文檔

    KLA

    SURFSCAN SP3

    verified-listing-icon

    已驗證

    類別
    Defect Inspection

    上次驗證: 28 天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    105386


    晶圓尺寸:

    未知


    年份:

    2017


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    KLA SURFSCAN SP3

    KLA

    SURFSCAN SP3

    Defect Inspection
    年份: 2017條件: 二手
    上次驗證28 天前

    KLA

    SURFSCAN SP3

    verified-listing-icon
    已驗證
    類別
    Defect Inspection
    上次驗證: 28 天前
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/cdae5ed88a0f4aacabfc5e46cc924226_5_mw.jpg
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/de11d5485f324c2e9f75537f1a547f84_3_mw.jpg
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/6fe591cd23fb481d8a73a832cd193501_1_mw.jpg
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/bb3f45609c314d11801e1e8cadcc4adb_2_mw.jpg
    listing-photo-660d5f95eed149879019a857a13f92c3-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/1705/660d5f95eed149879019a857a13f92c3/20382d6aa95e45e5b5cc296750f1e94b_4_mw.jpg
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    105386


    晶圓尺寸:

    未知


    年份:

    2017


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    HD not included Good working condition Wafer Inspection System
    配置
    無配置
    OEM 代工型號說明
    The Surfscan® SP3 is an unpatterned wafer inspection tool available in 450mm, 300mm, and 300mm/450mm bridge tool configurations. It uses deep ultra-violet (DUV) sensitivity and has a throughput up to three times that of its predecessor. It can detect critical defects and surface quality issues for IC, OEM, and substrate manufacturing at the 2Xnm design node. The tool also includes an integrated SURFmonitor module that characterizes and measures surface quality. It has flexible configurations and a reliable, extendible architecture. It is used for qualification and monitoring of process tools for the 2Xnm design node within the IC fab, as well as serving as a lithography process tool monitor. The Surfscan SP3 can also be used for incoming wafer qualification, inline process control, final wafer qualification, process tool qualification, and as a process uniformity monitor.
    文檔

    無文檔

    類似上架商品
    查看全部
    KLA SURFSCAN SP3

    KLA

    SURFSCAN SP3

    Defect Inspection年份: 2017條件: 二手上次驗證:28 天前
    KLA SURFSCAN SP3

    KLA

    SURFSCAN SP3

    Defect Inspection年份: 0條件: 翻新的上次驗證:超過60天前