跳到主要內容

2367

概述

The 2367 UV/visible brightfield inspector is sensitive to a broad range of defects for 65nm and above design nodes. It has improved throughput, high defect sampling, and is field-upgradeable from any 23xx systems. It has a 2x data rate increase, low false count rate, and automatic defect classification algorithms. It can be used with 28xx inspection systems and other KLA-Tencor tools. It also has a Process Window Qualification application for detecting systematic defects.

活躍中的上架商品

5

服務

檢驗、保險、評估、物流

最熱門的上架商品

有類似商品?
利用 Moov 將其上架並立即找到完美的買家。