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KLA 2139
    描述
    KLA 2139-UI User Interface Console Inspection Station Diagnose Monitor Interface Power Line Conditioner Exhaust Fan Box SAT (Segmented Auto threshold) MMED Quest Direct link Direct SECS Full wafer inspection Tool can inspect the blank and pattern 8inch wafer, GRR<l0% (Fab 2139 PCCB spec). Defect Review System can review and classify the defects after inspection. All defects should be real defects and in the blue box. And tool should also has Clustering/Sampling/Sorting function. Stage and Chuck: 8 inch (200mm) low contact chuck Y stage using Stepper motor X stage using linear motor and X Slider with air bearing Theta and Z Stage using ECS Temperature: 20-25°C CDA: 80PSI Electricity: AC 208V / 3 phase/ Frequency S0Hz
    配置
    無配置
    OEM 代工型號說明
    The 2139 wafer inspection system offers sensitivity and productivity enhancements for IC manufacturers. It is available as an independent tool or as an upgrade to existing 2135 and 2138 tools, allowing manufacturers to extend the life of their current KLA-Tencor tools. The 2139 is based on KLA-Tencor’s proven image processing technology and includes features such as ultra-broadband illumination and Segmented Auto Threshold technology. It is also available with an integrated SMIF mini-environment.
    文檔

    KLA

    2139

    verified-listing-icon

    已驗證

    類別
    Defect Inspection

    上次驗證: 超過60天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    89679


    晶圓尺寸:

    8"/200mm


    年份:

    2001


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    KLA 2139

    KLA

    2139

    Defect Inspection
    年份: 2001條件: 二手
    上次驗證超過60天前

    KLA

    2139

    verified-listing-icon
    已驗證
    類別
    Defect Inspection
    上次驗證: 超過60天前
    listing-photo-57b5b3557983413a9f45d8316bf8b4c5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74647/57b5b3557983413a9f45d8316bf8b4c5/cf7d2a0952514d0da7408c95ccad43f0_cdcecd0defeb4c47b2db72340808a0421201a_mw.jpeg
    listing-photo-57b5b3557983413a9f45d8316bf8b4c5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74647/57b5b3557983413a9f45d8316bf8b4c5/f84073c09c7e4eb1b9277cb12d771847_13b50f11b8684eee9e6cce2feef7acfe1201a_mw.jpeg
    listing-photo-57b5b3557983413a9f45d8316bf8b4c5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74647/57b5b3557983413a9f45d8316bf8b4c5/a566cc43bc02467880dc934de34ef39e_4a79581d04814612a6ffd558b39884fc1201a_mw.jpeg
    listing-photo-57b5b3557983413a9f45d8316bf8b4c5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74647/57b5b3557983413a9f45d8316bf8b4c5/4f29b615f2c94da08402242a268fd9c2_a2bbdf0aa87e4778b5319f30d34557601201a_mw.jpeg
    listing-photo-57b5b3557983413a9f45d8316bf8b4c5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74647/57b5b3557983413a9f45d8316bf8b4c5/c119c44ea68a48a78a9097007a8041b6_f77ccd1482c643ec8c12ecf045d9300e_mw.jpeg
    listing-photo-57b5b3557983413a9f45d8316bf8b4c5-https://media-moov-co.s3.us-west-1.amazonaws.com/user_media/listingPhoto/74647/57b5b3557983413a9f45d8316bf8b4c5/3ce429e423774c52bb06764a7b1901ce_c2173856b0c34bb689c4dc77633495711201a_mw.jpeg
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    89679


    晶圓尺寸:

    8"/200mm


    年份:

    2001


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    KLA 2139-UI User Interface Console Inspection Station Diagnose Monitor Interface Power Line Conditioner Exhaust Fan Box SAT (Segmented Auto threshold) MMED Quest Direct link Direct SECS Full wafer inspection Tool can inspect the blank and pattern 8inch wafer, GRR<l0% (Fab 2139 PCCB spec). Defect Review System can review and classify the defects after inspection. All defects should be real defects and in the blue box. And tool should also has Clustering/Sampling/Sorting function. Stage and Chuck: 8 inch (200mm) low contact chuck Y stage using Stepper motor X stage using linear motor and X Slider with air bearing Theta and Z Stage using ECS Temperature: 20-25°C CDA: 80PSI Electricity: AC 208V / 3 phase/ Frequency S0Hz
    配置
    無配置
    OEM 代工型號說明
    The 2139 wafer inspection system offers sensitivity and productivity enhancements for IC manufacturers. It is available as an independent tool or as an upgrade to existing 2135 and 2138 tools, allowing manufacturers to extend the life of their current KLA-Tencor tools. The 2139 is based on KLA-Tencor’s proven image processing technology and includes features such as ultra-broadband illumination and Segmented Auto Threshold technology. It is also available with an integrated SMIF mini-environment.
    文檔
    類似上架商品
    查看全部
    KLA 2139

    KLA

    2139

    Defect Inspection年份: 2001條件: 二手上次驗證:超過60天前
    KLA 2139

    KLA

    2139

    Defect Inspection年份: 0條件: 二手上次驗證:超過30天前
    KLA 2139

    KLA

    2139

    Defect Inspection年份: 0條件: 二手上次驗證:超過60天前