描述
Wafer SurfaceInspection配置
HDDOEM 代工型號說明
In late 1993, KLA introduced the new 2131 model for all pattern inspection which operates at up to twice the speed of the KLA 2130 and with higher sensitivity.文檔
無文檔
KLA
2131
已驗證
類別
Defect Inspection
上次驗證: 24 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
115260
晶圓尺寸:
6"/150mm
年份:
1994
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
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KLA
2131
類別
Defect Inspection
上次驗證: 24 天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
115260
晶圓尺寸:
6"/150mm
年份:
1994
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
Wafer SurfaceInspection配置
HDDOEM 代工型號說明
In late 1993, KLA introduced the new 2131 model for all pattern inspection which operates at up to twice the speed of the KLA 2130 and with higher sensitivity.文檔
無文檔