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6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA SPECTRAFX 100
    描述
    Film Thickness Measurement System
    配置
    無配置
    OEM 代工型號說明
    SpectraFx 100 is KLA-Tencor’s next-gen thin film metrology solution that meets the process control requirements for 90nm devices, including 193nm DUV lithography processes. It supports next-gen and “operator-free” 300mm fabs with advanced automation and tool-to-tool matching capabilities, reducing process development time for advanced materials and accelerating their adoption into volume production. It also enables extensive product wafer monitoring and characterization required to accurately measure advanced thin films. It fully supports SEMI requirements for communication to automation tracks and materials process flow, delivering the precision, stability, and matching required for advanced thin film-measurement applications for 90nm device production. It achieves exceptional tool-to-tool matching and enables the use of a small spot size on product wafers, eliminating the use of monitor wafers.
    文檔

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    KLA

    SPECTRAFX 100

    verified-listing-icon

    已驗證

    類別
    Defect Inspection

    上次驗證: 16 天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    106455


    晶圓尺寸:

    12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    KLA SPECTRAFX 100

    KLA

    SPECTRAFX 100

    Defect Inspection
    年份: 2003條件: 二手
    上次驗證超過60天前

    KLA

    SPECTRAFX 100

    verified-listing-icon
    已驗證
    類別
    Defect Inspection
    上次驗證: 16 天前
    listing-photo-d4175466aa2e49e380811e8928f064a3-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    106455


    晶圓尺寸:

    12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    Film Thickness Measurement System
    配置
    無配置
    OEM 代工型號說明
    SpectraFx 100 is KLA-Tencor’s next-gen thin film metrology solution that meets the process control requirements for 90nm devices, including 193nm DUV lithography processes. It supports next-gen and “operator-free” 300mm fabs with advanced automation and tool-to-tool matching capabilities, reducing process development time for advanced materials and accelerating their adoption into volume production. It also enables extensive product wafer monitoring and characterization required to accurately measure advanced thin films. It fully supports SEMI requirements for communication to automation tracks and materials process flow, delivering the precision, stability, and matching required for advanced thin film-measurement applications for 90nm device production. It achieves exceptional tool-to-tool matching and enables the use of a small spot size on product wafers, eliminating the use of monitor wafers.
    文檔

    無文檔

    類似上架商品
    查看全部
    KLA SPECTRAFX 100

    KLA

    SPECTRAFX 100

    Defect Inspection年份: 2003條件: 二手上次驗證:超過60天前
    KLA SPECTRAFX 100

    KLA

    SPECTRAFX 100

    Defect Inspection年份: 0條件: 二手上次驗證:16 天前
    KLA SPECTRAFX 100

    KLA

    SPECTRAFX 100

    Defect Inspection年份: 0條件: 二手上次驗證:16 天前