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描述
無描述配置
無配置OEM 代工型號說明
The Candela OSA 6100 and 6120 series systems introduce X-Beam channel technology, adding radial illumination to the existing circumferential illumination design, plus advanced collection optics that extend defect sensitivity down to 80nm. This multi-channel system simultaneously detects and classifies defects such as particles, pits and stains; characterizes lubricant thickness, and uses the Kerr Effect to characterize magnetic imaging.文檔
無文檔
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
90107
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
KLA
CANDELA 6120
類別
Defect Inspection
上次驗證: 超過60天前
關鍵商品詳情
條件:
Used
作業狀態:
未知
產品編號:
90107
晶圓尺寸:
未知
年份:
未知
Have Additional Questions?
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
無配置OEM 代工型號說明
The Candela OSA 6100 and 6120 series systems introduce X-Beam channel technology, adding radial illumination to the existing circumferential illumination design, plus advanced collection optics that extend defect sensitivity down to 80nm. This multi-channel system simultaneously detects and classifies defects such as particles, pits and stains; characterizes lubricant thickness, and uses the Kerr Effect to characterize magnetic imaging.文檔
無文檔