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6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
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6" Fab For Sale from Moov - Click Here to Learn More
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KLA AIT I
    描述
    METRO
    配置
    無配置
    OEM 代工型號說明
    The AIT In-line Defect Inspection System is a high-throughput system that uses proprietary double-darkfield (DDF) laser scanning technology to detect defects, microscratches, and particulate contamination on wafers. It can inspect up to 30 wafers per hour at maximum sensitivity and has a low cost-per-inspection, making it economically feasible to perform in-line process monitoring at more process levels. The system achieves exceptional defect sensitivity through innovations such as a reduced laser spot size and a unique double-darkfield laser scattering design.
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    KLA

    AIT I

    verified-listing-icon

    已驗證

    類別
    Defect Inspection

    上次驗證: 超過30天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    116510


    晶圓尺寸:

    8"/200mm


    年份:

    1999


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
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    KLA AIT I

    KLA

    AIT I

    Defect Inspection
    年份: 2008條件: 翻新的
    上次驗證超過60天前

    KLA

    AIT I

    verified-listing-icon
    已驗證
    類別
    Defect Inspection
    上次驗證: 超過30天前
    listing-photo-8440f368b5b445d98dbcdb122642d1d9-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    116510


    晶圓尺寸:

    8"/200mm


    年份:

    1999


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    METRO
    配置
    無配置
    OEM 代工型號說明
    The AIT In-line Defect Inspection System is a high-throughput system that uses proprietary double-darkfield (DDF) laser scanning technology to detect defects, microscratches, and particulate contamination on wafers. It can inspect up to 30 wafers per hour at maximum sensitivity and has a low cost-per-inspection, making it economically feasible to perform in-line process monitoring at more process levels. The system achieves exceptional defect sensitivity through innovations such as a reduced laser spot size and a unique double-darkfield laser scattering design.
    文檔

    無文檔

    類似上架商品
    查看全部
    KLA AIT I

    KLA

    AIT I

    Defect Inspection年份: 2008條件: 翻新的上次驗證:超過60天前
    KLA AIT I

    KLA

    AIT I

    Defect Inspection年份: 1996條件: 二手上次驗證:超過60天前
    KLA AIT I

    KLA

    AIT I

    Defect Inspection年份: 1997條件: 二手上次驗證:超過60天前