跳到主要內容
6" Fab For Sale from Moov - Click Here to Learn More
6" Fab For Sale from Moov - Click Here to Learn More
Moov logo

6" Fab For Sale from Moov - Click Here to Learn More
Moov Icon

COMPLUS

概述

Applied ComPlus-EV Inspection is the industry's only patterned wafer inspection system that performs high-speed inspection of all darkfield and key brightfield applications for 90nm production. Using proprietary Enlarged GrayField technology, this single-system solution detects a broad range of defect types at production throughput, enabling faster ramp and higher production yield.

活躍中的上架商品

0

服務

檢驗、保險、評估、物流

最熱門的上架商品

有類似商品?
利用 Moov 將其上架並立即找到完美的買家。