Advantest offers solutions for a wide variety of semiconductors and test needs, from SoC and memory, to R&D evaluation and system level test.

Resolution for faulty area detection: 5μm (Time domain: 0 to 800 ps, accumulated 16384 times), 10μm (Time domain: 800 to 1500 ps, accumulated 16384 times)

ADVANTEST

TS9001

The system accurately analyzes the wiring quality of various leading-edge semiconductor packages such as Flip Chip BGA, wafer level packages, and 2.5D/3D ICs using terahertz technology. It is a TDR analysis system that has the world’s top-class signal quality.

ADVANTEST

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TS9001

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TS9000

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