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APPLIED MATERIALS (AMAT) VeritySEM 4i
    描述
    SEM - Critical Dimension (CD) Measurement
    配置
    無配置
    OEM 代工型號說明
    The Applied VeritySEM4i, designed for sub-32nm metrology by Applied Materials, boasts a remarkable 1.5nm SEM resolution, optimal detection efficiency, and powerful image processing. The system highlights Fleet Matching with 0.3nm precision, and with its advanced SEM column design and algorithms, it tackles challenges like ArF resist shrinkage and SADP metrology. VeritySEM4i maximizes throughput, offers Å-level matching accuracy, and diminishes the need for multiple CD-SEM tools in fabs, resulting in boosted productivity and cost savings. Additionally, features like the Offline Recipe Generator streamline recipe creation, while OPC|CheckMax facilitates the automation of the OPC mask qualification process for sub-32nm chipmakers. Ultimately, VeritySEM4i encapsulates Applied Materials' vision to consistently innovate in the metrology and inspection industry.
    文檔

    無文檔

    APPLIED MATERIALS (AMAT)

    VeritySEM 4i

    verified-listing-icon

    已驗證

    類別
    CD-SEM

    上次驗證: 19 天前

    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    71316


    晶圓尺寸:

    12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    類似上架商品
    查看全部
    APPLIED MATERIALS (AMAT) VeritySEM 4i

    APPLIED MATERIALS (AMAT)

    VeritySEM 4i

    CD-SEM
    年份: 0條件: 二手
    上次驗證19 天前

    APPLIED MATERIALS (AMAT)

    VeritySEM 4i

    verified-listing-icon
    已驗證
    類別
    CD-SEM
    上次驗證: 19 天前
    listing-photo-5d49561dc41e497dac17afb0c0f702ff-https://d2pkkbyngq3xpw.cloudfront.net/moov_media/3.0-assets/photo-coming-soon-small.png
    關鍵商品詳情

    條件:

    Used


    作業狀態:

    未知


    產品編號:

    71316


    晶圓尺寸:

    12"/300mm


    年份:

    未知


    Have Additional Questions?
    Logistics Support
    Available
    Money Back Guarantee
    Available
    Transaction Insured by Moov
    Available
    Refurbishment Services
    Available
    描述
    SEM - Critical Dimension (CD) Measurement
    配置
    無配置
    OEM 代工型號說明
    The Applied VeritySEM4i, designed for sub-32nm metrology by Applied Materials, boasts a remarkable 1.5nm SEM resolution, optimal detection efficiency, and powerful image processing. The system highlights Fleet Matching with 0.3nm precision, and with its advanced SEM column design and algorithms, it tackles challenges like ArF resist shrinkage and SADP metrology. VeritySEM4i maximizes throughput, offers Å-level matching accuracy, and diminishes the need for multiple CD-SEM tools in fabs, resulting in boosted productivity and cost savings. Additionally, features like the Offline Recipe Generator streamline recipe creation, while OPC|CheckMax facilitates the automation of the OPC mask qualification process for sub-32nm chipmakers. Ultimately, VeritySEM4i encapsulates Applied Materials' vision to consistently innovate in the metrology and inspection industry.
    文檔

    無文檔

    類似上架商品
    查看全部
    APPLIED MATERIALS (AMAT) VeritySEM 4i

    APPLIED MATERIALS (AMAT)

    VeritySEM 4i

    CD-SEM年份: 0條件: 二手上次驗證:19 天前