描述
無描述配置
standard configuration, see specification X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc.Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag).System is fully packed on pallette (241kg, 1mx0,9mx1,5m)OEM 代工型號說明
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無文檔
OXFORD
CMI 950
已驗證
類別
Analytical
關鍵商品詳情
條件:
未知
作業狀態:
未知
產品編號:
12965
晶圓尺寸:
未知
年份:
2000
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Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
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OXFORD
CMI 950
已驗證
類別
Analytical
上次驗證: 超過60天前
關鍵商品詳情
條件:
未知
作業狀態:
未知
產品編號:
12965
晶圓尺寸:
未知
年份:
2000
Logistics Support
Available
Money Back Guarantee
Available
Transaction Insured by Moov
Available
Refurbishment Services
Available
描述
無描述配置
standard configuration, see specification X-Ray fluorescence for analysis of materials (such as liquids and solid states) in order to obtain information about thickness, concentrataion, etc.Measurement system for layer thickness analysis of metallic surfaces and evaluation of concentrations of solutions (Au, Ni, Sn, Cu, Ag).System is fully packed on pallette (241kg, 1mx0,9mx1,5m)OEM 代工型號說明
未提供文檔
無文檔
類似上架商品
查看全部無類似上架商品