We deliver superior solutions for temperature control, semiconductor analysis and bond process control.

The Wafer Profiler CVP21 is a handy tool to measure doping profiles in semiconductor layers by Electrochemical Capacitance Voltage Profiling (ECV-Profiling, CV-Profiling) in semiconductor research or production. This ECV Profiler (CV-Profiler, C-V-Profiler) furthermore is a very good choice to analyze or develop strategies for Photo-Electrochemical Wet Etching (PEC-Etching) of semiconductors.

WEP CONTROL

概述

活躍中的上架商品

全部產品

服務

最熱門的產品

CVP21

利用 Moov 將其上架並立即找到完美的買家。

所有產品

查看所有上架商品